With the proliferation of electronics into every corner of modern life, semiconductor manufacturing is a cornerstone of a huge range of industries. As a result, maintaining high standards of quality and efficiency within semiconductors is central to quality of life for everyone. And as the industry continues to grow and evolve, the role of semiconductor inspection and metrology solutions – both hardware and software – has become increasingly critical.
Hexagon’s quality inspection portfolio includes cutting-edge optical measurement devices, like laser interferometers, chromatic confocal white light sensors for non-contact inspection of sensitive semiconductor components and AI-powered software for data acquisition, processing and reporting. These tools ensure precise defect detection, dimensional verification, and adherence to stringent quality standards during production.
To give you a snapshot, here are three of the key reasons why AI-powered quality inspection should be at the heart of the semiconductor supply chain.
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Ensuring high-quality standards with semiconductor inspection
OK, this is probably obvious, but quality standards are a vitally important aspect of the electronics and semiconductor industries. Diving deeper inside, wafer inspection is an essential part of maintaining these high-quality standards required in semiconductor manufacturing. The process involves meticulous inspection of wafers to detect defects, cracks, voids, or other imperfections that could compromise the integrity of the finished product. Advanced optical inspection devices can be relied upon to ensure that each wafer meets stringent quality criteria without risk of damaging delicate surfaces in the process.
Quality management (QM) systems also play an important role in this process by providing a centralised, uniform framework helping organisations and suppliers to collaborate effectively, manage risks, and maintain consistent quality standards. This approach to quality assurance helps prevent costly scraps or recalls, protecting the company’s reputation, and ensures the reliability and safety of semiconductor products used in critical applications such as automobiles, medical devices and aviation.
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A spotlight on automated wafer inspection
Wafer inspection is an important process that lays the foundation for the entire electronics and semiconductor industry. At this point in the manufacturing process, the quality of wafers directly influences the performance and reliability of the finished products that find their way into a multitude of sectors. Historically, manufacturers have relied heavily on semi-automated detection and manual visual recognition to identify wafer defects. However, these methods have significant shortcomings, such as low efficiency and poor detection rates. The high reflectivity of wafers also adds complexity into the inspection process, requiring advanced sensors that can meet the very particular requirements. Accurate defect identification, annotation, and precise measurement of residual height and volume are essential to ensure that wafers meet the high standards needed for modern electronics manufacturing.
To address these challenges, manufacturing technology partners such as Hexagon are introducing innovative solutions that enhance the wafer inspection process. These advancements include the development of systems capable of configuring products of varying sizes, allowing for greater flexibility in the production line. Additionally, these solutions boast fast scanning speeds and high efficiency, significantly improving the throughput and accuracy of defect detection. The integration of automatic loading and unloading features streamlines the inspection process, reducing manual intervention and the potential for human error. Furthermore, automated measurement and data analysis software powered by AI provide comprehensive insights into wafer quality, enabling manufacturers to make informed decisions and optimise their operations. As the industry continues to evolve, these cutting-edge technologies are set to redefine wafer inspection, paving the way for more reliable and efficient semiconductor manufacturing.
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Reducing defects and improving yield rates with semiconductor inspection
One of the big benefits that come with significantly reducing defects in semiconductor manufacturing is the resulting improvements to yield rates. During the semiconductor manufacturing process, wafers undergo a variety of bonding and processing steps and any issues that arise, such as internal cracks or voids, can lead to defects in the finished semiconductor components. Early detection of these issues through precise inspection is highly valuable, minimising drops in yield and ensuring the quality of the final products.
Metrology hardware, such as optical CMMs (Coordinate Measuring Machines), are used to inspect wafer carriers for defects or deviations. This process ensures that wafer transfers are smooth and reliable, reducing the risk of wafer breakage and particle contamination. By maintaining high standards of precision and accuracy throughout this stage, these solutions help semiconductor manufacturers achieve optimal manufacturing efficiency, boosting yield rates.
Hexagon’s range of OPTIV CMMs.
Hexagon’s CMMs, such as the PMM-O, OPTIV and DELTA SLANT, deliver accurate measurements for high-tech manufacturing. Paired with PC-DMIS software, these systems streamline operations, reduce learning curves, and improve precision for components and modules. These CMMs also ensure both dimensional and cosmetic inspections at various steps throughout the semiconductor device packaging process.
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Enhancing overall efficiency and addressing shortage of skilled labour
And on that subject of efficiency, inspection technology is a powerful tool to support enhancing overall operational efficiency in semiconductor manufacturing. Solutions such as laser trackers can provide the data needed to optimise a wide range of key steps in the production cycle.
For instance, accurate machine alignment in lithography machines is crucial to achieve precise patterning and minimise defects. Laser trackers ensure that lithography machines achieve the tight tolerances required for high-quality semiconductor manufacturing.
By leveraging this type of technology, semiconductor manufacturers can adopt a ‘first-time right’ approach, ensuring that products are manufactured correctly from the outset. This reduces the need for rework, remanufacturing, or waste, ultimately enhancing overall operational efficiency and sustainability.
Conclusion
In conclusion, quality inspection processes are a critical aspect of semiconductor manufacturing that ensures high-quality standards, reduces defects, and enhances overall production efficiency. By integrating a range of advanced metrology solutions into the semiconductor supply chain, manufacturers can achieve greater operational efficiency, maintain stringent quality standards, and deliver reliable and high-performance semiconductor products. As the industry continues to grow and evolve, the importance of wafer inspection and metrology technology will only grow further.
Hexagon’s hardware and software solutions integrate quality assurance into manufacturing cycles via a digital thread, providing real-time data connectivity. This reduces defects, enhances efficiency, and minimises waste, ensuring high-quality outcomes across the entire semiconductor production cycle.
If this subject you are keen to learn more about, download our latest in-depth whitepaper: Leading the charge – digital solutions driving operational efficiency and supply chain integration in semiconductor manufacturing
